The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2015
Filed:
Jun. 29, 2013
Emc Corporation, Hopkinton, MA (US);
Eyal Kolman, Tel Aviv, IL;
Alon Kaufman, Bnei Dror, IL;
Yael Villa, Tel Aviv, IL;
Alex Vaystikh, Hod Hasharon, IL;
Ereli Eran, Tel Aviv, IL;
Eyal Yehowa Gruss, Tel Aviv, IL;
EMC Corporation, Hopkinton, MA (US);
Abstract
Data driven device detection is provided, whereby a device is detected by obtaining a plurality of feature values for a given device; obtaining a set of device attributes for a plurality of potential devices; calculating a probability value that the given device is each potential device within the plurality of potential devices; identifying a candidate device associated with a maximum probability value among the calculated probability values; and labeling the given device as the candidate device if the associated maximum probability value satisfies a predefined threshold. The predefined threshold can be a function, for example, of whether the given user has previously used this device. The obtained feature values can be obtained for a selected set of features satisfying one or more predefined characteristic criteria. The device attributes can be obtained, for example, from a profile for each of the plurality of potential devices.