The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2015

Filed:

Jun. 26, 2013
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Youngjun Heo, Daejeon, KR;

Seon-Gyoung Sohn, Daejeon, KR;

Dong Ho Kang, Daejeon, KR;

Byoung-Koo Kim, Daejeon, KR;

Jung-Chan Na, Daejeon, KR;

Ik Kyun Kim, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); H04L 29/06 (2006.01);
U.S. Cl.
CPC ...
H04L 63/1416 (2013.01);
Abstract

An apparatus for detecting an abnormality sign in a control system, the control system comprising control equipments, network equipments, security equipments or server equipments, the apparatus includes an information collection module configured to collect system information, network information, security event information or transaction information in interworking with a control equipments, network equipments, security equipments or server equipments. The apparatus includes storage module that stores the information collected by the information collection module. The apparatus includes an abnormality detection module configured to analyze a correlation between the collected information and a prescribed security policy to detect whether there is an abnormality sign in the control system.


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