The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2015
Filed:
Jul. 20, 2012
Atsushi Ito, Fujisawa, JP;
Hideo Takahashi, Yokohama, JP;
Takeshi Arisaka, Yokohama, JP;
Takumi Tomita, Yokohama, JP;
Atsushi Ito, Fujisawa, JP;
Hideo Takahashi, Yokohama, JP;
Takeshi Arisaka, Yokohama, JP;
Takumi Tomita, Yokohama, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A monitoring system is configured to perform a cause analysis of an event which occurs in any of a plurality of node apparatuses. The monitoring system is configured to store a plurality of rules indicating a correspondence relationship between one or more condition events regarding any of the plurality of node apparatuses, and a conclusion. The monitoring system is configured to specify the first conclusion associated with the detected condition event based on the rule, and perform a detection possibility judgment on whether the monitoring system can detect the condition event or not, for each of one or more condition events out of a plurality of condition events, and calculate the first index value indicating the certainty of the first conclusion being the cause, based on the existence of detection of one or more condition events associated with the first conclusion and the result of the detection possibility judgment.