The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2015
Filed:
Mar. 11, 2013
Applicant:
Qualcomm Incorporated, San Diego, CA (US);
Inventors:
Sudarsan Krishnan, San Diego, CA (US);
David Coronel, San Diego, CA (US);
Jay P. Shah, Sunnyvale, CA (US);
Assignee:
QUALCOMM Incorporated, San Diego, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 3/46 (2006.01); H04L 25/49 (2006.01); H04L 25/03 (2006.01); H03F 1/32 (2006.01); H04B 1/04 (2006.01);
U.S. Cl.
CPC ...
H04L 25/03343 (2013.01); H03F 1/3282 (2013.01); H04B 1/0475 (2013.01); H04B 2001/0425 (2013.01);
Abstract
A method and apparatus for characterized pre-distortion calibration is provided. The method begins with the selection of a number of devices to be characterized. The number of devices selected may be a subset of a larger group of devices. The selected number of devices is then characterized. The method avoids characterizing the large group of devices. The calibration of the group of devices is then based on the characterization of the selected number of devices.