The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2015

Filed:

Mar. 15, 2013
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Deepak Mathew, Acton, MA (US);

Ajay Anant Ingle, Austin, TX (US);

Mao Zeng, Austin, TX (US);

Marc M. Hoffman, Mansfield, MA (US);

Assignee:

Qualcomm Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/00 (2006.01); H04L 27/00 (2006.01); H04L 25/02 (2006.01); H04B 1/7075 (2011.01); H04B 1/7093 (2011.01);
U.S. Cl.
CPC ...
H04L 25/0212 (2013.01); H04B 1/7093 (2013.01); H04B 1/70752 (2013.01); H04B 2201/70707 (2013.01);
Abstract

An apparatus includes selection logic configured to select a first subset of a first set of samples stored at a first set of registers. The first subset includes a first sample stored at a first register of the first set of registers and further includes a second sample stored at a second register of the first set of registers. The apparatus further includes shift logic configured to shift a second set of samples stored at a second set of registers. The apparatus further includes a channel estimator configured to generate a first value associated with a channel estimate based on the first subset and further based on a second subset of the shifted second set of samples.


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