The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2015

Filed:

Jun. 16, 2014
Applicant:

Accedian Networks Inc., St-Laurent, CA;

Inventors:

Kjell Hansson, Rimbo, SE;

Olof Hagsand, Alta, SE;

Assignee:

Accedian Networks Inc., Saint-Laurent Quebec, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/00 (2009.01); H04J 7/00 (2006.01); H04L 7/00 (2006.01); H04J 3/06 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 7/0012 (2013.01); H04J 3/0658 (2013.01); H04J 3/0667 (2013.01); H04L 43/0858 (2013.01);
Abstract

A method for indicating one-way latency in a data network, with continuous clock synchronization, between first and second node having clocks that are not synchronized with each other includes a continuous synchronization session and a measurement session. The method repetitively sends predetermined synchronization messages from the first node to the second node and from the second node to the first node, calculates a round trip time for each message at the first node, updates a synchronization point if the calculated round trip time is smaller than a previously calculated round trip time, stores the updated synchronization points of a synchronization window, and calculates a virtual clock from the updated synchronization points of the synchronization window. The measurement session collects multiple measurements of one-way latency between the first and second nodes using the virtual clock, and generates a latency profile by interpolating the multiple measurements.


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