The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2015

Filed:

Feb. 22, 2013
Applicant:

Futurewei Technologies, Inc., Plano, TX (US);

Inventors:

Zhengxiang Ma, Summit, NJ (US);

Leonard Piazzi, Denville, NJ (US);

Alexis Pierides, Piscataway, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/40 (2006.01); G01S 7/28 (2006.01); H01Q 3/26 (2006.01); G01S 7/02 (2006.01); H01Q 1/24 (2006.01); H01Q 19/10 (2006.01); H01Q 23/00 (2006.01);
U.S. Cl.
CPC ...
H01Q 3/267 (2013.01); G01S 7/023 (2013.01); G01S 7/2813 (2013.01); G01S 7/40 (2013.01); G01S 7/4008 (2013.01); G01S 7/4017 (2013.01); G01S 7/4021 (2013.01); H01Q 1/246 (2013.01); H01Q 19/106 (2013.01); H01Q 23/00 (2013.01);
Abstract

Field-serviceable radio frequency modules can be achieved by replacing hard-wired radio frequency (RF) feedback paths with external near-field RF probes. Notably, the near-field RF probes may allow for the RF module to be installed/re-installed on a backplane or other support structure without fowling factory calibration settings. Multiple near-field RF probes can monitor a single RF module. Additionally, a single near-field RF probe can monitor multiple RF modules.


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