The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2015
Filed:
Nov. 21, 2011
Myoung Choul Choi, Chungcheongbuk-do, KR;
A Leum Park, Chungcheongbuk-do, KR;
Hyun Sik Kim, Daejeon, KR;
Seung Yong Kim, Daejeon, KR;
Jong Shin Yoo, Daejeon, KR;
Myoung Choul Choi, Chungcheongbuk-do, KR;
A Leum Park, Chungcheongbuk-do, KR;
Hyun Sik Kim, Daejeon, KR;
Seung Yong Kim, Daejeon, KR;
Jong Shin Yoo, Daejeon, KR;
KOREA BASIC SCIENCE INSTITUTE, Daejeon, KR;
Abstract
A Fourier transform ion cyclotron resonance mass spectrometer (FT-ICR MS) includes: an ionization source generating ions; a deceleration lens, on which the ions generated by the ionization source and spatially dispersed are incident, selectively decelerating the incident ions so as to decrease the distance between the ions; and an ion cyclotron resonance cell on which the ions passing through the deceleration lens are incident. By preventing dispersing of ions due to mass difference and converging the ions using the deceleration lens, the mass range that can be measured at one time can be extended. Also, measurement sensitivity can be improved since the ions are effectively introduced to the ICR cell.