The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2015
Filed:
Apr. 20, 2012
Shaohua Yang, Santa Clara, CA (US);
Weijun Tan, Longmont, CO (US);
Jefferson Singlelon, Westminster, CO (US);
Xuebin Wu, San Jose, CA (US);
Shaohua Yang, Santa Clara, CA (US);
Weijun Tan, Longmont, CO (US);
Jefferson Singlelon, Westminster, CO (US);
Xuebin Wu, San Jose, CA (US);
Avago Technologies General IP (Singapore) PTE. LTD., Singapore, SG;
Abstract
The present inventions are related to systems and methods for data processing, and more particularly to systems and methods for coasting one or more calibration loops based upon identification of a probability of data inaccuracies. One embodiment is a data processing system that includes: a defect detector circuit operable to identify a defect region during a first pass processing of a received data set; a defect location buffer operable to maintain an indication of the defect region in the received data set; and a calibration circuit operable to adaptively update a calibration output during a second pass processing of the received data set, where updating the calibration output is disabled for one or more samples of the received data set corresponding to the indication of the defect region.