The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2015
Filed:
Dec. 04, 2012
Fuji Xerox Co., Ltd., Minato-ku, Tokyo, JP;
David Lee, San Francisco, CA (US);
Donald Kimber, Foster City, CA (US);
James Vaughan, Mountain View, CA (US);
FUJI XEROX CO., LTD., Tokyo, JP;
Abstract
A method of creating a 3-D model by capturing partial 3-D models each comprising a sequence of 2-D images, analyzing each of the partial 3-D models to identify image features in the sequence of 2-D images of each of the partial 3-D models, identifying pairs of overlapping image features between the 2-D mages of each of the partial 3-D models by identifying image features in each 2-D image in the sequence of 2-D images of each of the partial 3-D models that overlaps image features in 2-D images of the sequence of 2-D images of the other partial 3-D models and selecting a 2-d image from each of the partial 3-D models, computing an initial transformation between 3-D coordinates of individual pairs of identified image features between the selected 2-D image from each of the partial 3-D models; and generating a final 3-D model based on the initial transformation.