The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2015
Filed:
Dec. 18, 2012
National University Corporation Kyoto University, Kyoto, Kyoto Prefecture, JP;
National University Corporation Kyoto University, Kyoto, JP;
Abstract
An x-ray CT image processing method which carries out a statistical estimate in prior knowledge relating to the movement and the x-ray absorption coefficient of a measurement subject comprises: a step of hypothesizing that the measurement subject changes smoothly over time, and defining a first probability model (prior knowledge of the measurement subject over all times) relating to movement and a second probability model (projected image observation model over all times) relating to observation; and a step of carrying out a statistical estimate dependent on both the first probability model and the second probability model. The first probability model relating to the movement of the measurement subject and the second model relating to observation are defined as probability models with which statistical estimates are carried out at the outset, and motion and CT images are simultaneously estimated by carrying out induction based on the probability models.
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