The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2015
Filed:
Jan. 30, 2013
Seiko Epson Corporation, Tokyo, JP;
Seiko Epson Corporation, , JP;
Abstract
An inspecting apparatus includes an image pickup unit configured to pick up a plurality of images of an inspection target object with different exposure times and generate, image data of an inspection target object image including an inspection region, a weighted-image-data generating unit configured to weight, for each of the image data generated with the exposure times different from one another, data of pixels indicating a region where a difference in gradation of pixel values is relatively large among regions of pixels included in the image data and generate weighted image data, an image-data combining unit configured to generate combined image data obtained by combining the generated respective weighted image data, and a determining unit configured to determine a state of the inspection region on the basis of image data of a reference image set and the generated combined image data.