The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2015
Filed:
May. 26, 2010
Yusuke Hara, Tokyo, JP;
Joseph M. Alyea, Edmonds, WA (US);
Cherie G. Wong, Seattle, WA (US);
Amazon Technologies, Inc., Reno, NV (US);
Abstract
Various embodiments of a system and method for process management in a materials handling facility are described. Embodiments may include a process control component configured to generate a model of multiple unit handling processes of a materials handling facility. For each process, the model may indicate a measured throughput rate. The process control component may be configured to, based on at least one target output rate that is a goal for the output rate of a given unit handling process, evaluate the model to generate a particular target throughput rate that is a goal for the respective throughput rate of a particular unit handling process that is performed prior to the given unit handling process. The process control component may be configured to, based on the particular target throughput rate, generate one or more instructions to control the respective throughput rate of units processed by the particular unit handling process.