The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2015
Filed:
Jul. 28, 2011
Mariko Yamamoto, Kokubunji, JP;
Shin-ichiro Umemura, Sendai, JP;
Takashi Azuma, Fuchu, JP;
Kunio Hashiba, Tokyo, JP;
Mariko Yamamoto, Kokubunji, JP;
Shin-ichiro Umemura, Sendai, JP;
Takashi Azuma, Fuchu, JP;
Kunio Hashiba, Tokyo, JP;
HITACHI MEDICAL CORPORATION, Tokyo, JP;
Abstract
An objective is to enable calculation of a distribution of a physical property such as a density inside a measurement object, even when the distribution of the physical property value is non-uniform, within a feasible period of time without causing image deterioration due to phenomena such as refraction and multiple-reflections caused by the non-uniformity. To this end, the physical property value that makes an evaluation quantity be an extremum is outputted, where the evaluation quantity is a liner sum or a product of exponential function of: an equation residual quantity that is a residual being a difference between an operator term and an external force term of an equation of motion; a non-uniformity detection equation residual quantity that is a residual of an equation of detecting the non-uniformity of the physical property value from a matching degree of solutions of the equation of motion under two types of boundary conditions; and a conditional equation residual quantity that is a residual of a constraint condition.