The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2015

Filed:

Dec. 27, 2012
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Ya-Ling Chen, Hsinchu, TW;

Ding-Jun Yin, Tainan, TW;

Kuo-Yang Hung, Taoyuan County, TW;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2013.01); G06F 21/57 (2013.01); G06F 17/30 (2006.01); G06F 21/62 (2013.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 17/30289 (2013.01); G06F 17/30424 (2013.01); G06F 21/6254 (2013.01); G06F 2221/034 (2013.01);
Abstract

An anonymous dataset generation method comprises following steps. A critical attribute set and a quasi-identifier (QID) set are acquired, and one of the critical attribute and the quasi-identifier is set as an anchor attribute. An attribute sequence and an equivalence table are generated according to the quasi-identifier set and the critical attribute set. A data cluster and a cluster table are generated according to the equivalence table. The content of the cluster table is generalized to generate and output an anonymous dataset corresponding to an original dataset. A risk evaluation method for an anonymous dataset calculates data weight to extract distinctive data and to attacking defects of the anonymous dataset according to the distinctive data, thereby enhancing a risk evaluation efficiency of the anonymous dataset.


Find Patent Forward Citations

Loading…