The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2015

Filed:

Jul. 25, 2012
Applicants:

Scott P. Nixon, Fort Collins, CO (US);

Tiger LU, Toronto, CA;

Eric M. Rentschler, Windsor, CO (US);

Inventors:

Scott P. Nixon, Fort Collins, CO (US);

Tiger Lu, Toronto, CA;

Eric M. Rentschler, Windsor, CO (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/364 (2013.01); G06F 11/3648 (2013.01);
Abstract

The present invention provides a method and apparatus for dynamically configuring debug triggering patterns. One example embodiment of the method includes comparing values of bits received on a first subset of a plurality of lines of a bus with a first pattern of bits and capturing values of bits received on a second subset of the plurality of lines of the bus in response to the comparison indicating that the values of the bits received on the first subset of the lines match the first pattern of bits. The exemplary embodiment of the method also includes defining a second pattern for triggering a debug action using the captured values.


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