The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2015
Filed:
May. 01, 2012
Satish K. Sadasivam, Tamilnadu, IN;
Prathiba Kumar, Tamilnadu, IN;
Rajan Ravindran, Karnataka, IN;
Sangram Alapati, Austin, TX (US);
Satish K. Sadasivam, Tamilnadu, IN;
Prathiba Kumar, Tamilnadu, IN;
Rajan Ravindran, Karnataka, IN;
Sangram Alapati, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
The present disclosure includes, but is not limited to, a method, system and computer-usable medium for improving performance measurement by analyzing the various events in a multiplexing counting mode and configuring the sampling time accordingly to more effectively performing the sampling. In certain embodiments, when groups of operations are identified for sampling, the present disclosure generates a time sampling table for these groups of operations. The time sampling table is dynamically altered during the runtime of the application to alter the sampling interval of each group. The sampling interval of each group can be increased or decreased based on a threshold of occurrence of the event. This disclosure provides more accurate performance measurement of important events and facilitates a determination of how important events impact application performance.