The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2015

Filed:

Oct. 30, 2014
Applicant:

Splunk Inc., San Francisco, CA (US);

Inventors:

Tristan Antonio Fletcher, Pacifica, CA (US);

Alok Anant Bhide, Mountain View, CA (US);

Assignee:

Splunk, Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30554 (2013.01); G06F 17/30958 (2013.01);
Abstract

A service monitoring system receives a selection of key performance indicators (KPIs) that each indicate a different aspect of how a service provided by one or more entities is performing. Each entity of the one or more entities produces machine data or wherein each entity has its operation reflected in machine data not produced by the entity. Each KPI is defined by a different search query that derives one or more values from the machine data pertaining to the one or more entities providing the service, where each of the one or more values is associated with a point in time and representing the aspect of how the service is performing at the associated point in time. For each of the selected KPIs, the service monitoring system derives the one or more values and causes display of a graphical visualization of the derived one or more values for the KPI along a time-based graph lane. The graph lanes for the selected KPIs are parallel to each other and the graphical visualizations in the graph lanes are all calibrated to a same time scale.


Find Patent Forward Citations

Loading…