The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2015

Filed:

Apr. 20, 2012
Applicant:

Dean Eric Sequera, Vienna, VA (US);

Inventor:

Dean Eric Sequera, Vienna, VA (US);

Assignee:

Dynex Technologies, Inc., Chantilly, VA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G06F 19/10 (2011.01); G06F 19/20 (2011.01); G01N 33/50 (2006.01); G06K 9/00 (2006.01); G06K 9/40 (2006.01); G06K 9/36 (2006.01); G06F 19/24 (2011.01);
U.S. Cl.
CPC ...
G06F 19/10 (2013.01); G06F 19/20 (2013.01); G06F 19/24 (2013.01);
Abstract

A method of analyzing reagent beads retained in a sample well of a sample plate is disclosed comprising obtaining an image of a reagent bead, distributing intensity values of image pixels amongst a plurality of intensity bins and generating an histogram. A curve is fitted to the histogram and the curve is compared with an idealized profile of image pixels. A closeness of fit between the curve and the idealized profile is determined and then intensity values are discarded from one or more of the intensity bins. The remaining intensity values are redistributed and the process is repeated several times. A determination is then made as to which curve has the closest fit with the idealized profile.


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