The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2015

Filed:

Mar. 18, 2013
Applicant:

SK Hynix Inc., Icheon-si Gyeonggi-do, KR;

Inventors:

Young Suk Seo, Icheon-si, KR;

Ho Uk Song, Icheon-si, KR;

Jun Hyun Chun, Icheon-si, KR;

Tae Jin Kang, Icheon-si, KR;

Assignee:

SK Hynix Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/00 (2006.01); G01R 31/26 (2014.01); G11C 29/02 (2006.01); G11C 29/12 (2006.01); G11C 29/50 (2006.01); G11C 7/22 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2644 (2013.01); G11C 29/023 (2013.01); G11C 29/028 (2013.01); G11C 29/12015 (2013.01); G11C 29/50012 (2013.01); G11C 7/222 (2013.01);
Abstract

A semiconductor apparatus includes: an output timing controller configured to delay an applied external read command by a predetermined time and generate a normal output enable flag signal, during a normal mode, a test output timing controller configured to generate a DLL clock signal from an external clock signal, delay the applied external read command in synchronization with the DLL clock signal, and output the delayed applied external read command as a test output enable flag signal, during a test mode, and a multiplexer (MUX) configured to output any one of the normal output enable flag signal or the test output enable flag signal as an output enable flag signal.


Find Patent Forward Citations

Loading…