The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2015
Filed:
Aug. 21, 2012
Jonathan M. Haylock, Los Angeles, CA (US);
Robert J. Hill, Salinas, CA (US);
Peter G. Panagas, Santa Clara, CA (US);
Jonathan M. Haylock, Los Angeles, CA (US);
Robert J. Hill, Salinas, CA (US);
Peter G. Panagas, Santa Clara, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
A test system may be provided in which devices under test are tested using radio-frequency test stations. A test station may include a test host, a test unit coupled to the test host, and a shielded enclosure. The shielded enclosure may contain a test antenna coupled to the test unit via a radio-frequency cable. A computer-controlled loading arm may be used to place a device under test on a positioner within the test enclosure. The test enclosure may have an enclosure door that is opened and closed using a computer-controlled pneumatic cylinder. When the enclosure door is closed, a portion of the enclosure door may actuate one or more levers on the positioner, which may in turn actuate one or more positioning arms to press the device under test against one or more guide surfaces on the positioner, thereby precisely positioning the device under test within the test enclosure.