The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2015

Filed:

May. 10, 2011
Applicants:

Tanya Moreno, San Diego, CA (US);

Cindy Wang, San Diego, CA (US);

David Becker, San Diego, CA (US);

Inventors:

Tanya Moreno, San Diego, CA (US);

Cindy Wang, San Diego, CA (US);

David Becker, San Diego, CA (US);

Assignee:

Pathway Genomics Corporation, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); B01L 7/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6452 (2013.01); B01L 7/52 (2013.01);
Abstract

Dual mode genetics testing systems are devised about a single element testing platform. A microfluidic network and system of interconnected receiving cells and reaction vessels supports at the same time genotyping and copy number analysis where the platform may be subject to a common thermal cycle schedule to cause the proper reactions (DNA replication) necessary in both test types. Further, the microfluidic platform which includes reaction vessels for genotyping which are spatially removed from reaction vessels for copy number analysis, is coupled to optical scanner and detection systems specifically arranged to apply test specific detection routines on each of these distinct regions or portions of the dual mode test platform.


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