The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2015

Filed:

Mar. 14, 2013
Applicant:

Ecolab Usa Inc., Naperville, IL (US);

Inventors:

Arthur J Kahaian, Chicago, IL (US);

Dmitri L Kouznetsov, Aurora, IL (US);

John E Hoots, Batavia, IL (US);

Rodney H Banks, Aurora, IL (US);

David Ambrose, St. Charles, IL (US);

Assignee:

Ecolab USA Inc., Naperville, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/02 (2006.01); G01N 5/02 (2006.01); G01N 17/00 (2006.01); G01N 29/24 (2006.01);
U.S. Cl.
CPC ...
G01N 5/02 (2013.01); G01N 17/008 (2013.01); G01N 29/022 (2013.01); G01N 29/2443 (2013.01); G01N 2291/0256 (2013.01); G01N 2291/0258 (2013.01); G01N 2291/0426 (2013.01);
Abstract

Methods for monitoring scale deposition in a water-containing industrial process are disclosed. In certain embodiments, the water-containing industrial process is an aqueous cooling system. In certain embodiments, the methods incorporate fluorometric monitoring and control techniques along with a piezoelectric microbalance sensor. A particular embodiment of a piezoelectric microbalance sensor is additionally disclosed, along with at least one method for using the particular embodiment that is independent of whether fluorometric monitoring and control techniques are utilized.


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