The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2015
Filed:
Nov. 03, 2010
Kwon Sang Ryu, Daejeon, KR;
Soo Young Park, Daejeon, KR;
Seung Hoon Nahm, Daejeon, KR;
Young IL Kim, Daejeon, KR;
Kwon Sang Ryu, Daejeon, KR;
Soo Young Park, Daejeon, KR;
Seung Hoon Nahm, Daejeon, KR;
Young Il Kim, Daejeon, KR;
Korea Research Institute of Standards and Science, Daejeon, KR;
Abstract
Provided is a ΔE measuring device minimizing external magnetic disturbance, more particularly, a ΔE measuring device measuring a change (ΔE) in elastic modulus under a magnetic field by removing a bias effect by the earth's magnetic field and a magnetic tool and device and using a magneto acoustic resonance method. With the ΔE measuring device, a space minimizing external magnetic disturbance using three-axis Helmholtz coils is provided and the ΔE measuring device having a plurality of coil structures is inserted into the space, thereby making it possible to minimize external magnetic field disturbance.