The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2015

Filed:

Sep. 13, 2013
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Chen-Chin Cheng, Hsinchu, TW;

Jian-Shian Lin, Yilan, TW;

Min-Chieh Chou, Taipei, TW;

Yu-Tang Chen, Taipei, TW;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/04 (2006.01); G01J 1/02 (2006.01); G01J 1/42 (2006.01);
U.S. Cl.
CPC ...
G01J 1/0204 (2013.01); G01J 1/0271 (2013.01); G01J 1/0422 (2013.01); G01J 2001/0481 (2013.01); G01J 2001/4252 (2013.01);
Abstract

An optical measuring device includes a case, a reflective layer and a light collecting lens module. A measuring chamber and a channel, which is connected to the measuring chamber and is connected to an opening of the case, reside in the case. The reflective layer is disposed onto an inner surface of the measuring chamber. The light collecting lens module is located inside the channel. A light beam emits into the channel of the optical measuring device through an opening, passes through the light collecting lens module and enters the measuring chamber afterward.


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