The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2015

Filed:

Mar. 29, 2011
Applicants:

Juan E. Sandoval, St. Petersburg, FL (US);

Nicholas I. Sapankevych, Clearwater, FL (US);

Sara R. Lemley, Clearwater, FL (US);

Inventors:

Juan E. Sandoval, St. Petersburg, FL (US);

Nicholas I. Sapankevych, Clearwater, FL (US);

Sara R. Lemley, Clearwater, FL (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05D 1/00 (2006.01); G06F 15/173 (2006.01); G01C 21/20 (2006.01); H04L 12/701 (2013.01);
U.S. Cl.
CPC ...
G01C 21/20 (2013.01); H04L 45/00 (2013.01);
Abstract

In certain embodiments, path determination includes receiving terrain elevation data comprising elevation values for locations of an area, where each elevation value indicates an elevation at a location. One or more gradient matrices are calculated from the elevation values. Each gradient matrix comprises gradient values corresponding to the locations. Traversable segments are determined from the gradient matrices, and a path is determined from the traversable segments.


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