The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2015
Filed:
Oct. 24, 2013
Applicant:
Ingrain, Inc., Houston, TX (US);
Inventors:
Bryan Guzman, Houston, TX (US);
Naum Derzhi, Houston, TX (US);
Assignee:
Ingrain, Inc., Houston, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01); E21B 49/02 (2006.01); G01N 23/225 (2006.01); G01N 1/36 (2006.01); G01N 33/24 (2006.01);
U.S. Cl.
CPC ...
E21B 49/02 (2013.01); G01N 1/36 (2013.01); G01N 23/046 (2013.01); G01N 23/225 (2013.01); G01N 33/241 (2013.01); G01N 2223/419 (2013.01); G01N 2223/616 (2013.01);
Abstract
A method is provided to allow characterization of rock or other types of samples using a sliver that is prepared to have a sample and optionally a plurality of thin discrete reference objects encapsulated by hardened encapsulant that surrounds the peripheral edges of the sample and any reference objects. Systems for performing the methods are also provided. An x-ray scannable sliver also is provided as a single unit that has a thin discrete sample and a plurality of thin discrete reference objects encapsulated by hardened encapsulant that encases the peripheral edges of the sample and reference objects.