The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2015
Filed:
Sep. 28, 2011
Naoki Isogai, Nishio, JP;
Masaaki Hanebuchi, Aichi, JP;
Toshio Murata, Milpitas, CA (US);
NIDEK CO., LTD., Gamagori-shi, JP;
Abstract
A method of observing a three-dimensional image of an examinee's eye to be examined, includes: obtaining a first three-dimensional image which is a three-dimensional image of an anterior segment of the examinee's eye by optical coherence tomography for obtaining a tomographic image by converging a measurement light on the anterior segment of the examinee's eye; obtaining a second three-dimensional image which is a three-dimensional image of a fundus of the examinee's eye by optical coherence tomography for obtaining a tomographic image by converging the measurement light on the fundus of the examinee's eye by a timing different from a timing of obtaining the first three-dimensional image; constructing a three-dimensional eyeball image of the examinee's eye through image processing based on the obtained first and second three-dimensional images; and displaying the constructed three-dimensional eyeball image on a monitor.