The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2015

Filed:

Aug. 23, 2013
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Shigeaki Ono, Tokyo, JP;

Yukio Sakagawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/12 (2006.01); A61B 3/00 (2006.01); A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
A61B 3/0058 (2013.01); A61B 3/102 (2013.01);
Abstract

For appropriately obtaining the tomographic image and the layer thickness map are provided in a short period of time regardless of involuntary eye movement, when the tomographic image is to be obtained in a specific scan pattern, a 3D tomographic image is first obtained by 3D scan, and then a tomographic image of a desired part is extracted from the image in accordance with the specific scan pattern. Further, based on the obtained 3D tomographic image, a sector for layer thickness map display, a main scanning line, and a sub-scanning line, which are displayed on a fundus image, are set movable, and tomographic images taken along both the scanning lines after the movement are obtained. The sector having a center corresponding to the intersection between those scanning lines and the layer thickness map are recalculated and displayed so as to follow the intersection.


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