The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2015

Filed:

Jun. 26, 2012
Applicants:

Jiong Zhang, Irvine, CA (US);

Joseph King, Aliso Viejo, CA (US);

Akira Ito, Irvine, CA (US);

Inventors:

Jiong Zhang, Irvine, CA (US);

Joseph King, Aliso Viejo, CA (US);

Akira Ito, Irvine, CA (US);

Assignee:

Broadcom Corporation, Irvine, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01G 4/002 (2006.01); H01L 23/522 (2006.01); H01L 27/08 (2006.01);
U.S. Cl.
CPC ...
H01L 23/5223 (2013.01); H01L 27/0805 (2013.01); Y10T 29/417 (2015.01);
Abstract

A semiconductor structure may implement a metal-oxide-metal capacitor. When layer design rules change from one layer to the next, the structure may change the direction of the interleaved plates of the capacitor. For example, when the metallization width or spacing design rules change from layer M3 to layer M4, the structure may run the capacitor traces in different directions (e.g., orthogonal to one another) on M3 as compared to M4. Among the layers that adhere to the same design rules, for example layers M1, M2, and M3, the structure may run the capacitor traces in the same direction in each of the layers M1, M2, and M3. In this way, the capacitor traces overlap to large extent without misalignment on layers that have the same design rules, and the structure avoids misalignment of the capacitor traces when the design rules change.


Find Patent Forward Citations

Loading…