The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2015

Filed:

Nov. 01, 2012
Applicant:

Agency for Science, Technology and Research, Singapore, SG;

Inventors:

Zhimin Yuan, Singapore, SG;

Bo Liu, Singapore, SG;

Shengbin Hu, Singapore, SG;

Chun Lian Ong, Singapore, SG;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/60 (2006.01); G11B 27/36 (2006.01);
U.S. Cl.
CPC ...
G11B 27/36 (2013.01); G11B 5/607 (2013.01); G11B 5/6011 (2013.01); G11B 5/6029 (2013.01);
Abstract

A method for measuring a change in a spacing between a head and a storage medium of a data storage system. The method includes obtaining a first readback signal from the storage medium using the head at a first spacing between the head and the storage medium, determining a first power spectrum density over a frequency range from the obtained first readback signal, obtaining a second readback signal from the storage medium using the head at a second spacing between the head and the storage medium, determining a second power spectrum density over the frequency range from the obtained second readback signal, and providing a measurement indicative of the change in the spacing based on the determined first power spectrum density and the determined second power spectrum density. A data storage system is also provided.


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