The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2015

Filed:

Sep. 12, 2012
Applicants:

Howell Hollis, Orlando, FL (US);

Zach Barth, Issaquah, WA (US);

Inventors:

Howell Hollis, Orlando, FL (US);

Zach Barth, Issaquah, WA (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/00 (2011.01); G06T 17/00 (2006.01); G06T 15/80 (2011.01);
U.S. Cl.
CPC ...
G06T 15/80 (2013.01);
Abstract

A multi-layer digital elevation model (DEM) structure is disclosed. A device may access a first structure that comprises a plurality of first elevation values and a plurality of location identifiers that may correspond to a geographic region. The first elevation values may be associated with a first layer in the geographic region and correspond to respective location identifiers. The device may access a second structure that identifies a second layer in the geographic region. Second elevation values that may correspond to at least some of the plurality of location identifiers may be determined. A multi-layer DEM structure may be generated that stores the first elevation values and the second elevation values in association with corresponding location identifiers.


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