The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2015

Filed:

Feb. 05, 2013
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Yong-hwa Park, Yongin-si, KR;

Jang-woo You, Yongin-si, KR;

Hee-sun Yoon, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/00 (2011.01); G06T 15/08 (2011.01); G01S 17/08 (2006.01); G01S 17/89 (2006.01);
U.S. Cl.
CPC ...
G06T 15/08 (2013.01); G01S 17/08 (2013.01); G01S 17/89 (2013.01);
Abstract

A method for extracting depth information, which may include extracting depth information relating to an object by using an actual nonlinear waveform instead of a mathematically ideal waveform and simultaneously may include effectively removing errors due to random noises that may be caused in a light source, an light modulator, an imaging device, or the like, is provided. The method may include performing simple multiplex and addition on captured images and performing a search of a look-up table. Thus, correct distance information may be extracted without being affected by a type of waveform being used, and an amount of memory which is used and calculated for removing random noise may be reduced.


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