The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2015
Filed:
May. 03, 2013
Impac Medical Systems, Inc., Sunnyvale, CA (US);
Yan Zhou, Maryland Heights, MO (US);
Xiao Han, Maryland Heights, MO (US);
Lyndon S. Hibbard, Maryland Heights, MO (US);
Virgil M. Willcut, Maryland Heights, MO (US);
IMPAC MEDICAL SYSTEMS, INC., Sunnyvale, CA (US);
Abstract
Disclosed herein are techniques for performing automated structure delineation on image data using trained landmark detectors and a shape refinement tool. The landmark detectors can be trained to detect a landmark in the image data based on image features that are indicative of intensity variations over a plurality of windows of the image data points. A machine-learning algorithm can be used to train the landmark detectors. The landmarks in the image data that are detected by the trained landmark detects can be used to initialize an iterative shape refinement to thereby compute a refined shape estimate for a structure of interest such as a prostate.