The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2015
Filed:
Jul. 19, 2012
Sharath Venkatesha, Golden Valley, MN (US);
Saad J. Bedros, West St. Paul, MN (US);
Jan Jelinek, Plymouth, MN (US);
Sharath Venkatesha, Golden Valley, MN (US);
Saad J. Bedros, West St. Paul, MN (US);
Jan Jelinek, Plymouth, MN (US);
Honeywell International Inc., Morristown, NJ (US);
Abstract
A system receives an iris image and segments the iris region. The segmented iris region is mapped to a unit disk and partitioned into local iris regions (or sectors) as a function of the radius and angle The system calculates localized Zernike moments for a plurality of regions of the unit disk. The localized Zernike moment includes a projection of the local iris region into a space of Zernike polynomial orthogonal basis functions. The system generates an iris feature set from the localized Zernike moments for each partitioned region, excluding the regions which are comprised by occlusion. The iris features are weighted based on the conditions of blur, gaze and occlusion of the iris region. A probe iris image is then matched to a plurality of iris images in a database based on the distance of its feature set to the corresponding plurality of iris feature sets.