The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2015

Filed:

Jun. 07, 2011
Applicant:

John J. Michelsen, Irving, TX (US);

Inventor:

John J. Michelsen, Irving, TX (US);

Assignee:

INTERACTIVE TKO, INC., Plano, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/36 (2006.01); G06F 11/34 (2006.01); G06F 9/445 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 11/3466 (2013.01); G06F 9/44589 (2013.01); G06F 11/3688 (2013.01);
Abstract

A request to generate a defect report is received for a defect observed within a software system under test. Context information is identified, provided by a plurality of instrumentation units, each instrumentation unit in the plurality of instrumentation units monitoring one or more respective software components within the system under test. The context information identifies characteristics of transactions performed in the system under test. At least some of the identified context information is automatically associated with the defect. The requested defect report is generated to include the context information associated with the identified defect.


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