The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2015

Filed:

May. 30, 2014
Applicant:

Honeywell International Inc., Morristown, NJ (US);

Inventors:

Vinay Huddar, Karnataka, IN;

Balasubramanyam Ravindranath, Karnataka, IN;

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3664 (2013.01); G06F 11/3688 (2013.01);
Abstract

A method of non-intrusively measuring a memory profile of a thread under test comprises executing a detection thread in parallel with the thread under test, the thread under test executed on a first core of a multi-core processor and the detection thread executed on a second core of the multi-core processor; generating a pattern of cache miss memory reads on the detection thread in order to access a memory shared by the first core and the second core; periodically obtaining read times in the detection thread indicating the amount of time taken to complete the cache miss memory reads generated on the detection thread; and determining the memory profile of the thread under test based on the obtained read times of the detection thread.


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