The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2015

Filed:

Aug. 31, 2011
Applicants:

Gavin R. Jewell, Seattle, WA (US);

Luke F. Kearney, Navan, IE;

Inventors:

Gavin R. Jewell, Seattle, WA (US);

Luke F. Kearney, Navan, IE;

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0784 (2013.01);
Abstract

Systems and methods are provided for mapping dependencies between system components and for analyzing and acting on possible root causes for anomalies experienced by the system components. Aspects of the present disclosure may present for display information associated with the dependency maps and ranked lists of possible root causes of anomalies. Ranking comprises determination of which operating parameters of related system components, when anomalous, will have the greatest effect on the operation of monitored system components. When possible root causes are ranked, notifications may be issued to alert administrators or other systems of the anomaly and the likely root causes.


Find Patent Forward Citations

Jewell, Gavin. (2015). Root cause detection service (U.S. Patent No. 9122602). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9122602

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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