The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2015

Filed:

Feb. 26, 2010
Applicants:

Hiroki Uchiyama, Kawasaki, JP;

Shinya Yuda, Hitachi, JP;

Hideaki Suzuki, Hitachi, JP;

Kozo Nakamura, Hitachiota, JP;

Inventors:

Hiroki Uchiyama, Kawasaki, JP;

Shinya Yuda, Hitachi, JP;

Hideaki Suzuki, Hitachi, JP;

Kozo Nakamura, Hitachiota, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0221 (2013.01); G05B 23/0278 (2013.01); G05B 2219/24019 (2013.01); G05B 2219/24042 (2013.01);
Abstract

The invention is related to a system and a method to determine whether a target equipment deviates from a normal state. If it is determined that the target equipment to be diagnosed deviates from the normal state, the degree of deviation of each parameter from the normal state as the reference is calculated as an abnormal contribution ratio. A failure cause is estimated from a similarity ratio between the calculated abnormal contribution ratio and the abnormal contribution ratio of each of the failure causes collected in the past and including failure phenomena and failure parts.


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