The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2015
Filed:
Feb. 21, 2013
Mitsubishi Electronic Corporation, Chiyoda-ku, Tokyo, JP;
Mitsubishi Electric Corporation, Tokyo, JP;
Abstract
An interference checking device includes a contour shape analyzing unit that extracts a contour shape of a tool cross section and a tool length by analyzing a two-dimensional image of a rotating tool, a rotation center analyzing unit that obtains a rotation center of the rotating tool by analyzing the contour shape, a three-dimensional-rotation-shape generating unit that generates a three-dimensional shape of the rotating tool on the basis of the contour shape, the tool length, and the rotation center, and an interference check processing unit that checks whether the rotating tool and a component other than the rotating tool interfere with each other when numerical control machining is performed on a workpiece by using the rotating tool, by using the three-dimensional shape, in which the three-dimensional-rotation-shape generating unit generates the three-dimensional shape by using a left-side contour shape.