The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2015

Filed:

Nov. 12, 2013
Applicant:

Ricoh Imaging Company, Ltd., Tokyo, JP;

Inventor:

Tatsuyuki Onozaki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 9/04 (2006.01); G02B 13/06 (2006.01); G02B 13/18 (2006.01);
U.S. Cl.
CPC ...
G02B 13/06 (2013.01); G02B 13/18 (2013.01);
Abstract

A superwide-angle lens system includes a positive front lens group and a negative rear lens group, in that order from the object side, wherein the negative rear lens group serves as a focusing lens group that is moved in the optical axis direction when focusing on an object at infinity to an object at a finite distance. The following condition (1) is satisfied:1.1<<2.0  (1),wherein mR designates the lateral magnification of the negative rear lens group when focusing on an object at infinity.


Find Patent Forward Citations

Onozaki, Tatsuyuki. (2015). Superwide-angle lens system (U.S. Patent No. 9122040). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9122040

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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