The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2015
Filed:
Apr. 24, 2013
Olympus Corporation, Tokyo, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
An optical measurement apparatus that measures an optical property of a scattering medium includes a light source that supplies illumination light having at least one spectral component, an illumination fiber for guiding the light supplied by the light source and emitting the light to the scattering medium, a detection fiber for receiving returned light from the scattering medium at a tip thereof and guiding the returned light toward a base end thereof, a detecting unit that detects light output from the base end of the detection fiber, a measuring unit that measures a property of the scattering medium based on a detection result obtained by the detecting unit, and a switching unit that switches between total areas of emission regions, in which light is emitted, at an end face of the illumination fiber.