The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2015
Filed:
Oct. 14, 2008
Ram C. Naidu, Newton, MA (US);
Chitra Subramanian, Salem, MA (US);
Sergey B. Simanovsky, Brookline, MA (US);
Zhengrong Ying, Belmont, MA (US);
Dong-yueh Liang, Sudbury, MA (US);
Douglas Q. Abraham, Topsfield, MA (US);
Ram C. Naidu, Newton, MA (US);
Chitra Subramanian, Salem, MA (US);
Sergey B. Simanovsky, Brookline, MA (US);
Zhengrong Ying, Belmont, MA (US);
Dong-Yueh Liang, Sudbury, MA (US);
Douglas Q. Abraham, Topsfield, MA (US);
Analogic Corporation, Peabody, MA (US);
Abstract
Radiation flux can be adjusted 'on the fly' as an object () is being scanned in a security examination apparatus. Adjustments are made to the radiation flux based upon radiation incident on a first radiation detector () in an upstream portion () of an examination region. The object under examination is thus exposed to different radiation flux in coordination with a downstream motion () of the object relative to a second radiation detector (). The radiation flux is adjusted so that a sufficient number of x-rays (that traverse the object) are incident on the second radiation detector. Images of the object can then be generated based upon data from the second radiation detector, where these images are thus of a desired/higher quality.