The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2015
Filed:
Apr. 22, 2013
Koganei Corporation, Tokyo, JP;
Yoshinari Fukada, Koganei, JP;
Fumihito Meguro, Fuchu, JP;
KOGANEI CORPORATION, , JP;
Abstract
There is provided a potential measuring device of non-contact type which can improve measurement sensitivity. A potential measuring device which measures a charged object in a non-contact manner with a sensor includes: a first shutter and a second shutter each having a shutter part provided with an opening and a leaf spring part; a magnet attached to the leaf spring part of each of the first shutter and the second shutter; a yoke on which a coil is disposed, the coil applying an alternating magnetic field to the magnet of each of the first shutter and the second shutter to cause the shutter part to reciprocate via the leaf spring part; and a natural frequency adjusting means for adjusting a natural frequency of at least one of a first shutter system including the first shutter and the magnet and a second shutter system including the second shutter and the magnet.