The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2015
Filed:
Jul. 11, 2012
Applicant:
Peter Lindner, Langquaid, DE;
Inventor:
Peter Lindner, Langquaid, DE;
Assignee:
KRONES AG, Neutraubling, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01J 1/42 (2006.01); B07C 5/34 (2006.01); G01N 21/90 (2006.01);
U.S. Cl.
CPC ...
G01J 1/42 (2013.01); B07C 5/3408 (2013.01); G01N 21/90 (2013.01); G01N 21/9072 (2013.01); G01N 21/9081 (2013.01);
Abstract
A method and a device for inspecting containers and/or preforms. A scattering medium is provided in the interior of the containers or preforms and is irradiated in such manner that the scattering medium forms a bright field behind the container or preform wall area to be imaged. In this way, the wall area can easily be illuminated and imaged from different directions, so that inspection units can be created with a high degree of design freedom and with smaller dimensions.