The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2015
Filed:
Aug. 30, 2011
Zhe Wang, Beijing, CN;
Zheng LI, Beijing, CN;
Tingbi Yuan, Beijing, CN;
Zongyu Hou, Beijing, CN;
Lizhi LI, Beijing, CN;
Jie Feng, Beijing, CN;
Zhe Wang, Beijing, CN;
Zheng Li, Beijing, CN;
Tingbi Yuan, Beijing, CN;
Zongyu Hou, Beijing, CN;
Lizhi Li, Beijing, CN;
Jie Feng, Beijing, CN;
TSINGHUA UNIVERSITY, Beijing, CN;
Abstract
The present invention provides a method and a system for improving the precision of element measurement based on laser-induced breakdown spectroscopy. The method comprises: press-forming a sample to be measured with a tablet press; making a cavity on or immediately above a surface of the press formed sample; forming a layer of aerosol immediately above the surface of the sample to be measured with the components thereof completely identical to those of the sample to be measured; testing the sample to be measured by using a laser-induced breakdown spectroscopic system, so as to obtain the intensities of the characteristic spectral lines of a target element in the sample to be measured; and determining the concentration of the target element in the sample to be measured according to a calibration curve of the target element in prearranged calibration samples.