The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2015
Filed:
Mar. 07, 2013
Massachusetts Insititute of Technology, Cambridge, MA (US);
Dean Marko Ljubicic, Somerville, MA (US);
Brian W. Anthony, Cambridge, MA (US);
Massachusetts Institute of Technology, Cambridge, MA (US);
Abstract
System for measuring thickness and lateral position of a transparent object. The system includes a camera having a sensor for receiving light, the camera including an objective lens for focusing on an object plane and having an optical axis and a field of view. A source of light is provided to illuminate a surface having variations in reflected light intensity. The surface is spaced apart from the objective lens and disposed at an angle with respect to the optical axis of the objective lens. A transparent object disposed fully or partially between the objective lens and the surface will shift the position of the object plane, the shift in object plane being proportional to the thickness of the object, and the transparent object, when partially inserted between the objective lens and the surface, will focus a fraction of the light on a lower plane, this fraction of light being proportional to the fraction of the lens field of view occupied by the transparent object that is related to lateral position.