The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2015

Filed:

Jan. 19, 2011
Applicants:

Shigeto Marumoto, Hirakata, JP;

Hideyuki Wakai, Yashio, JP;

Yukihiro Suzaki, Kawasaki, JP;

Daijirou Itou, Hirakata, JP;

Tomoyuki Tsubaki, West Java, ID;

Kenichi Hisamatsu, Hirakata, JP;

Inventors:

Shigeto Marumoto, Hirakata, JP;

Hideyuki Wakai, Yashio, JP;

Yukihiro Suzaki, Kawasaki, JP;

Daijirou Itou, Hirakata, JP;

Tomoyuki Tsubaki, West Java, ID;

Kenichi Hisamatsu, Hirakata, JP;

Assignee:

KOMATSU LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 5/00 (2006.01); G01B 21/20 (2006.01); G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
G01B 21/20 (2013.01); G01B 11/24 (2013.01);
Abstract

A wear amount measuring device includes an image display unit, an image processing unit, and a wear amount computing unit. The image display unit displays a real object image based on real object image data containing a wear amount measurement target and a reference part, and displays a plan image based on design plan data containing the wear amount measurement target and the reference part. The image processing unit executes an image processing of overlapping the real object image and the plan image at an equal scale on a corresponding positional relation when the reference parts are matched. The wear amount computing unit computes a wear amount based on a magnitude of an interval between a measurement contour line drawn along a contour of the wear amount measurement target in the real object image and a plan contour line in the plan image.


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