The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2015
Filed:
Apr. 29, 2010
William David Mawby, Greenville, SC (US);
Jimmy Jeter, Simpsonville, SC (US);
William David Mawby, Greenville, SC (US);
Jimmy Jeter, Simpsonville, SC (US);
MICHELIN RECHERCHE et TECHNIQUE S.A., Granges-Paccot, CH;
COMPAGNIE GENERALE DES ETABLISSEMENTS MICHELIN, Clermont-Ferrand, FR;
Abstract
A system and related method for improving tire uniformity includes providing a number (n) of test tires manufactured in a known order and identifying at least one candidate cyclic process effect with a corresponding frequency of introduction (f). A given uniformity parameter, such as radial or lateral run-out, balance, mass variation, radial lateral or tangential force variation, is measured for each tire in the test set, and measured data points are combined into a concatenated composite waveform. At least one process harmonic associated with each identified cyclic process effect is separated from the tire harmonics, for example, by Fourier transformation with identification of the process harmonics as positive integer multiples of the mth harmonic of the measured uniformity parameter where m=n/f. Once the process harmonics are extracted, filtered uniformity measurements can be provided or new tires can be built with the process effect minimized.