The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2015
Filed:
Dec. 27, 2012
Applicant:
Lexmark International, Inc., Lexington, KY (US);
Inventors:
Mark Joseph Edwards, Lexington, KY (US);
John Paul NeCamp, II, Georgetown, KY (US);
Assignee:
Lexmark International, Inc., Lexington, KY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 15/00 (2006.01); H04N 1/00 (2006.01); H04N 1/40 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00045 (2013.01); H04N 1/0005 (2013.01); H04N 1/00013 (2013.01); H04N 1/00037 (2013.01); H04N 1/00063 (2013.01); H04N 1/00076 (2013.01); H04N 1/00551 (2013.01); H04N 1/40056 (2013.01);
Abstract
A scanner and process for detecting a scan lid open condition. The scan lid open condition is detected by aligning two scan bars with one another, illumining one of the scan bars with a predetermined illumining pattern and during the illumining, scanning the illumined scan bar with the other scan bar. The response of the scanning scan bar is compared with an expected response for the illumining pattern with the scan lid closed. If a positive comparison occurs, the scan lid is closed. If a negative comparison occurs, the scan lid is open.